Multiple Use Microscopy Calibration and AFM Profilometry MRS-3

Multiple Use Microscopy Calibration and AFM Profilometry MRS-3

Marsoni

M251S

$2440.05

Get it in 3 business days with 1 day shipping. Friday, May 29

Multiple Use Microscopy Calibration and AFM Profilometry MRS-3The 10 x 50,000x Pitch Standard for Scanning Electron Microscopy Details of Traceability to NIST, NPL or ISO 9000 Compliance Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies and Profilometry STM, AFM, the pattern height is 100nm Optical Microscopy transmitted, reflected, bright dark field, differential contrast and confocal Chemical mapping EDS, WDS, XRF, XPS, Auger and others.

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